Test Printer Engines or LCD Display Drivers.Evaluate Media Storage Devices and Components (HDD, FDD, ODD, DVD).Characterize and Verify ASIC, FPGA and DACs.Create Complex Data Patterns with Sophisticated Sequence, Looping, Jump on Event and Tri-state Output Control.Simulate Missing Functions in System or Subsystem Evaluation.Characterize Device Timing for TTL, CMOS, ECL Families.Ultra Low Jitter for Clock Substitution.Integrate into ATE Systems via GPIB/RS-232-C Interface.Import Pattern Data with DG-link Software Utility.Large Display for Easy-to-Use Data Editing.Flexible Sequence Control with Jump, Event and Nested Loops.Complementary Output (DG2040) Assures Excellent Signal Fidelity.Fast Transition Times to 150 ps (DG2040) Aids Fast Logic Evaluation.Tri-state Output Control (DG2020A, DG2030).Variable Rise and Fall Time Control (DG2030).Precise Control of Output Parameters Include:.
#DG2020A DATA GENERATOR SERIAL#
Control of Edge Timing (DG2040) Permits Jitter Simulation in Serial Data Streams.Multiple Output Channels Increases Flexibility:.Data Pattern Depth to 256 K/channel Speeds Characterization.Data Rate to 1.1 Gb/s Tests High-speed Logic Devices and Circuits.
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